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Half-module ID: 12
All test data and results
http://slac.stanford.edu/~meeg/SVT_production/half_module/12
Parameter |
Value |
ICAL |
|
ISHA |
|
VFP |
|
VFS |
|
Temperature |
|
Test data: http://slac.stanford.edu/~meeg/SVT_production/half_module/12/1/data
Test results (images and numerical values): http://slac.stanford.edu/~meeg/SVT_production/half_module/12/1/plots
Baseline run
Pedestal and noise (black markers are for all samples together, colored markers are individual samples)
Sample-to-sample shift
Noise correlations
Physical channel ordering:
PDF:
Readout channel ordering:
PDF:
Timing calibration runs, aggregate shaping curve fits
Fit parameters (colors identify calibration groups)
Timing calibration runs, hit-by-hit fits
Linearity of fitted T0 (ideal CR-RC fit on left, spline fit on right)
Goodness of fit (ideal CR-RC fit on left, spline fit on right)
Time resolution at each calibration delay (ideal CR-RC fit - stars mark error reported by fitter, dots mark spread in distribution of fitted values)
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