Availability and General Information
Five MCC boards have been mounted and tested at SLAC. Three have been sent to CERN for testbeam and two are kept at SLAC.
MCC Board ID |
MCC CHIP |
Location |
---|---|---|
18019195 |
25/27 |
CERN |
18019196 |
25/26 |
CERN |
18019197 |
25/20 |
CERN |
18019198 |
25/28 |
SLAC |
18019199 |
25/25 |
SLAC |
Schematics of the MCC board: MCC_board_schematics.pdf and the Genova Pixel R&D page
Some photos of the setup used at SLAC for testing are shown here:
Low Voltage Power Scheme:
As in the regular setup, the TPCC board has to be powered with +5V and -5V. The MCC board has to be powered with +3.3V. To power the Single Chip Board with Analog=1.6V and Digital=2.0V, there are two options:
- Through the TPCC (as in the regular setup). Only the +3.3V has to be connected to the MCC. NO jumpers in J46,47,48.
- Through the MCC. In that case, only one cable is connected to the TPCC (the cable carrying +5 and -5 V, for the TPCC itself) and the other cable is disconnected, as shown in the last picture. The 1.6V and 2.0V are connected to the MCC, and a jumper is needed at J48 ONLY. This is the scheme shown on the picture below (the Analog and Digital levels are still plugged in the connector though):
Initial tests at CERN
The tests were carried out using TurboDaq 5.9 on the new EUDET DAQ PC in Lab 161 at CERN by P. Hansson, A. La Rosa and G. Troska.
Summary of the MCC tests with 3 single chips:
- FBK-3EM8 (0/0)
- STA-3EG (1/F)
- FBK-3EM4 (2/1)
The number in parenthesis is the ("chip nr"/"Geographical address").
The tuned configurations including capacitance/vcal was loaded (some were old and may need to be redone) and a configuration file was saved in TEST2/.
In all cases only the first 3 channels were used and except for the single channel tests at SLAC before shipping the other have not yet been tested.
Test ID |
MCC Board ID/MCC CHIP |
Sensors |
DIGITAL SRAM |
THRESHOLD |
SOURCE |
---|---|---|---|---|---|
1 |
25/20 |
1,2,3 |
OK |
OK |
OK |
2 |
25/26 |
1, 3 |
OK |
OK |
OK |
3 |
25/27 |
1,3 |
OK |
OK |
OK |
Test ID 1
Digital test:
Threshold scan
HV was applied. Sensor 1=-15V, sensor 2,3=-15V
Test ID 2
Digital test:
Threshold scan:
Source test:
1000 triggers
Test ID 3
Digital test:
Threshold scan:
Source test: