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If we want to perform all measurements at each scan step of the bias voltage, B field and beam angle, and assuming a 50% data taking efficiency:

8 (Bias V) x 2 (B field) x 2 (beam angle) x 4 (hours) / 50%  = 256 hours = 11 days. The testbeam is 15 days, so we should have enough time.

One way of gaining time (and this could be the minimum run plan), would be not to do Bias scan at all beam angle, and take 2 bias steps at the 15 degree incident angle:

*\[ 8 (Bias V) x 2 (B field) x 1 (beam angle) x 4 (hours) +*

It has to be checked if 4 hours are sufficient for the high statistics measurements, such as the efficiency maps. The high statistics measurements do not have to be done at each setting/scan step, so we can certainly envisage to spend more time on several scan steps. Similarly, we can envisage to take more steps in B field and Beam incident angle for a few bias voltage settings only.