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  • Run source scan with >1 chip, moving the source over the chips to see hits in all attached chips for same source scan Pelle & Alessandro
  • Run with BAT software after modification to check online monitoring
    • To see correlated plots we could either use cosmics with a stack of chips or a source. The latter option has the problem of penetration depth and the former has the problem of statistics?

DUT's & rough run plan

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10-17 October

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  • List of devices under test
    • STA-3D (2E,3E and 4E?)
      • Check if the 2E and 4E can be revived Pelle, Alessandro
    • CNM
    • SINTEF
    • FBK (irradiated?)

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  • Charge sharing
  • Electrode charge collection efficiency

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24-04 November

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This assumes that we have access to the Morpurgo magnet.

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  • Angle scan
  • Magnetic field strength scan

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20-25 November

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This period is in H6 without magnetic field.

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