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- Run source scan with >1 chip, moving the source over the chips to see hits in all attached chips for same source scan Pelle & Alessandro
- Run with BAT software after modification to check online monitoring
- To see correlated plots we could either use cosmics with a stack of chips or a source. The latter option has the problem of penetration depth and the former has the problem of statistics?
DUT's & rough run plan
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10-17 October
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- List of devices under test
- STA-3D (2E,3E and 4E?)
- Check if the 2E and 4E can be revived Pelle, Alessandro
- CNM
- SINTEF
- FBK (irradiated?)
- STA-3D (2E,3E and 4E?)
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- Charge sharing
- Electrode charge collection efficiency
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24-04 November
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This assumes that we have access to the Morpurgo magnet.
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- Angle scan
- Magnetic field strength scan
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20-25 November
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This period is in H6 without magnetic field.
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