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Old Version 2

changes.mady.by.user Spellman, Alic Shen

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New Version 3

changes.mady.by.user Spellman, Alic Shen

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Pinhole Testing

Bottom: NONE

Top: NONE


IV Test:

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Baseline Configuration:

0V bias

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60V bias

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iCalScan Analysis:

60,70,80 cg pulses hadded

Image Added