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Collimator scattering at JLab - link
Pre-NLCTA beam test slides from Pelle - link
Summary of results from beam test from Pelle - link
Sensor probing results in lab - link
Calibration and lab tests after pulling wirebonds from Omar - link
Simulation of beam parameters
Beam loss scenario with silicon edge hit
Intensity "per strip" (60um wide bands): 150um or 500um sigma beam spot, 50um or 500um Be exit window, 10cm or 30cm downstream of exit, Air included
10pC:
100pC:
Beam spot for one of them as example:
Beam loss scenario with direct hit
Beam parameters - 500um beam spot - 177cm & 6 foils
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Beam parameters - 150um beam spot
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Data
NLCTA runs:
/u1/software/daq/baseline_XpC_YF_ZV_HHMM.bin
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Calibration:
180V bias: /u1/data/SVT2014/half_module/gimp_lab_postnlcta/1/
220V bias: /u1/data/SVT2014/half_module/gimp_lab_postnlcta/2/
Log book
10/2/13
We observed that there was a new channel that had high noise after installation. It was not there during test with the source. Could be dust or a real pin hole
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10:37
Move in foils one by one and observe beam spot on phosphor screen. Picture and extracted spot size at each thickness can be seen below. The screen is about 75cm downstream of the exit window.
# foils | Tiff | FWHM |
|---|---|---|
0 |
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1 |
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2 |
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3 |
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4 |
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5 |
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6 |
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7 |
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We should check if we can extract the beam spot size on the Be window from this data and ask Mike if it's consistent with his experience.
10:49
Lower bunch charge.
Insert 6 foils.
Still possible to see the beam on the phosphor screen but barely.
Mike estimates this to be order of 1fC/bunch.
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Runs taken, all at 6 foils:
Time | Bunch charge (pC) | ADC1 | Bias (V) | Ileak (uA) | Baseline | Baseline 180V | Comment | |||
|---|---|---|---|---|---|---|---|---|---|---|
~11:00 | ?~0.001 | - | 180 | 10 | links | links |
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11:36 | 1.0 | 0.002 | 180 | 17 |
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| 1.0 | 0.002 | 250 | 22 |
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| 1.0 | 0.002 | 350 | 22 | |||||
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| 1 | 0.002 | 400 | 38 | |||
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| 1 | 0.002 | 500 | 21 |
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12:00 | 10 | 0.01 | 180 | 6 | ||||||
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| 10 | 0.01 | 350 | 7 |
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| 10 | 0.01 | 500 | 50 |
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| 100 | 0.135 | 180 | 7 | ||||||
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| 100 | 0.135 | 250 | 6 | |||
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| 100 | 0.135 | 350 | 14 |
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11:36
Everything looks ok for 1pC setting.
Baseline taken at 180V, after irradiating with 1 pC at 180V:
Baseline taken at 250V, after irradiating with 1 pC at 250V:
Baseline taken at 180V, after irradiating with 1 pC at 250V:
Baseline taken at 350V, after irradiating with 1 pC at 350V:
Baseline taken at 180V, after irradiating with 1 pC at 350V:
Baseline taken at 400V, after irradiating with 1 pC at 400V:
Baseline taken at 180V, after irradiating with 1 pC at 400V:
Baseline taken at 450V, after irradiating with 1 pC at 450V:
Baseline taken at 180V, after irradiating with 1 pC at 450V:
Baseline taken at 500V, after irradiating with 1 pC at 500V:
Baseline taken at 180V, after irradiating with 1 pC at 500V:
12:00
At 10pC and 500V we observed a channel with x3 higher noise in the "weird" apv chip which looked like a pinhole candidate. However, after cycling the bias it went awayit seem to go away with lower bias voltage.
We observe a previously unseen step in the noise from 30 to 35 ADC in the middle of both working APV25. This step was turning on over a couple of channels. Not sure what this is.
Baseline taken at 180V, after irradiating with 10 pC at 180V:
Baseline taken at 350V, after irradiating with 10 pC at 350V:
Baseline taken at 180V, after irradiating with 10 pC at 350V:
Baseline taken at 500V, after irradiating with 10 pC at 500V:
Baseline taken at 180V, after irradiating with 10 pC at 500V:
12:15
Continue to 100pC and 180V.
Here we see a drastic change and what looks like many shorts has developed across the sensors. We don't see any case where the channel get a larger noise but they all go down to a level of about 20ADC.
The step in noise also become worse.
Baseline taken at 180V, after irradiating with 100 pC at 180V:
Baseline taken at 250V, after irradiating with 100 pC at 250V:
Baseline taken at 180V, after irradiating with 100 pC at 250V:
Baseline taken at 350V, after irradiating with 100 pC at 350V:
Baseline taken at 180V, after irradiating with 100 pC at 350V:
12:30
At 100pC and 350V.
Here we see a large increase in number of channels that are "shorted".
Interesting it seems like the behavior depends very sharply on the bias voltage setting. If we go to 210V the shorts are less pronounced but spike up above 215.
We don't see any real changes on the leakage current.
Since we'd like to keep some channels alive we stop at this point.
Baseline taken at 180V, after irradiating with 100 pC at 180V:
Baseline taken at 250V, after irradiating with 100 pC at 250V:
Baseline taken at 180V, after irradiating with 100 pC at 250V:
Baseline taken at 350V, after irradiating with 100 pC at 350V:
Baseline taken at 180V, after irradiating with 100 pC at 350V:
10/3/13
Baseline taken at 180V in group C:
Operation
DAQ Desktop Setup
IP address: 172.27.244.72
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Keithley 2400
Manual
Serial: 9600 8N1unmigrated-wiki-markup
Common commands:
"measure?" - returns \ [voltage, current, \ ]
"source:voltage?" - returns voltage
"source:voltage 10" - set to 10 V
"output on" - output on
"output?" - returns 1 for on, 0 for off
"source:voltage:range up/down" - change range for voltage setting
BK Precision 1697
Manual
Serial:
Common commands:
"SOUT000" - enable output
"SOUT001" - disable output
"VOLT00XY.Z" - sets voltage to XY.Z Volts
Pictures
Lab prep
GIMP current vs bias
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Overview
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